DocumentCode
2742475
Title
Enhancing pipelined processor architectures with fast autonomous recovery of transient faults
Author
Jeitler, Marcus ; Lechner, Jakob ; Steininger, Andreas
Author_Institution
Inst. of Comput. Eng., Vienna Univ. of Technol., Vienna, Austria
fYear
2010
fDate
14-16 April 2010
Firstpage
233
Lastpage
236
Abstract
Recent technology trends have made radiation-induced soft errors a growing threat to the reliability of microprocessors, a problem previously only known to the aerospace industry. Therefore, the ability to handle higher soft error rates in modern processor architectures is essential in order to allow further technology scaling. This paper presents an efficient fault-tolerance method for pipeline-based processors using temporal redundancy. Instructions are executed twice at each pipeline stage, which allows the detection of transient faults. Once a fault is detected the execution is stopped immediately and recovery is implicitly performed within the pipeline stages. Due to this fast reaction the fault is contained at its origin and no expensive rollback operation is required later on.
Keywords
Circuit faults; Computer architecture; Error analysis; Fault detection; Fault tolerance; Microprocessors; Pipelines; Pulse circuits; Redundancy; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
Conference_Location
Vienna, Austria
Print_ISBN
978-1-4244-6612-2
Type
conf
DOI
10.1109/DDECS.2010.5491776
Filename
5491776
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