Title :
Millimeter Wave Dielectric Permittivity Measurements of Common Materials
Author :
Nguyen, K.N. ; Chen, S. ; Afsar, Mohammed N. ; Korolev, Konstantin A
Author_Institution :
Tufts Univ., Medford
Abstract :
Millimeter-wave transmittance measurements of common household powdered materials over the frequency range spanning from 35 GHz to 120 GHz. Frequency dependences of real and imaginary parts of the dielectric permittivity have been calculated from the transmittance spectra. This wide band spectroscopy makes use of a backward wave oscillator as a high power tunable source of radiation which is preferable for the measurement of high absorbing materials due to the higher level of radiation transmission through the sample.
Keywords :
absorbing media; backward wave oscillators; millimetre wave measurement; millimetre wave spectroscopy; permittivity measurement; backward wave oscillator; common household powdered materials; common materials; frequency 35 GHz to 120 GHz; millimeter wave dielectric permittivity measurements; millimeter-wave transmittance measurements; radiation transmission; transmittance spectra; wide band spectroscopy; Dielectric materials; Dielectric measurements; Electric variables measurement; Electrochemical impedance spectroscopy; Frequency measurement; Millimeter wave measurements; Millimeter wave technology; Oscillators; Permittivity measurement; Powders;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368691
