DocumentCode :
2742760
Title :
Development of advanced millimeter-wave plasma diagnostics
Author :
Mase, A. ; Itakura, A. ; Hojo, H. ; Watabe, K. ; Mizuno, K. ; Matsuura, H. ; Uchida, K. ; Miura, A. ; Domier, C.W. ; Luhmann, N.C., Jr.
Author_Institution :
Adv. Sci. & Technol. Center for Cooperative Res., Kyushu Univ., Fukuoka, Japan
fYear :
2000
fDate :
12-15 Sept. 2000
Firstpage :
85
Lastpage :
86
Abstract :
This paper reports on the recent results of two types of millimeter-wave plasma diagnostics, reflectometry and imaging, applied to a tandem mirror plasma. The ultrafast-sweep broadband and ultrashort-pulse reflectometry provide reliable density profiles under the existence of density fluctuations. The combination of high performance system and advanced data analysis methods are necessary for automatic evaluation of density profiles. A millimeter-wave imaging array in the frequency range of 60-90 GHz has been successfully applied for measurements of line-density and electron cyclotron emission (ECE) profiles. It is being installed in Large Helical Device (LHD). In order to cover the frequency range of the second harmonic ECE on LHD (120-180 GHz), a new detector using MMIC technology has been designed and fabricated.
Keywords :
fusion reactor instrumentation; microwave reflectometry; millimetre wave imaging; plasma density; plasma diagnostics; stellarators; 120 to 180 GHz; 60 to 90 GHz; LHD; Large Helical Device; MMIC technology; density fluctuations; density profiles; electron cyclotron emission; line-density; millimeter-wave plasma diagnostics; mm-wave imaging; mm-wave reflectometry; second harmonic ECE; tandem mirror plasma; ultrashort-pulse reflectometry; Data analysis; Electron emission; Fluctuations; Frequency measurement; Millimeter wave measurements; Millimeter wave technology; Mirrors; Plasma density; Plasma diagnostics; Reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6513-5
Type :
conf
DOI :
10.1109/ICIMW.2000.892947
Filename :
892947
Link To Document :
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