Title :
Application and analysis of IDDQ diagnostic software
Author :
Nigh, Phil ; Forlenza, Donato ; Motika, Franco
Author_Institution :
IBM Microelectron., Essex Junction, VT, USA
Abstract :
A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a methodology for performing defect localization based upon IDDq test information (only). Using this technique, fault localization can be completed within minutes (e.g. <5 minutes) after IC testing is complete. This technique supports multiple fault models and has been successfully applied to a large number of samples-including ones that have been verified through failure analysis. Data is presented related to key issues such as diagnostic resolution, hardware-to-fault model correlation, diagnostic current thresholds, and the diagnosability of various defect types
Keywords :
CMOS digital integrated circuits; application specific integrated circuits; automatic test software; electric current measurement; fault location; integrated circuit testing; logic testing; CMOS IC; IC testing; IDDQ diagnostic software; IDDq testing; bridging fault; defect localization; defect types; diagnostic current threshold; diagnostic resolution; failure analysis; fault localization; hardware-to-fault model correlation; multiple fault models; software-based diagnostic tools; Application software; Circuit faults; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Integrated circuit modeling; Integrated circuit testing; Logic testing; Software testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639633
