Application and analysis of IDDQ diagnostic software

Author

Nigh, Phil ; Forlenza, Donato ; Motika, Franco

Author_Institution

IBM Microelectron., Essex Junction, VT, USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

319

Lastpage

327

Abstract

A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a methodology for performing defect localization based upon IDDq test information (only). Using this technique, fault localization can be completed within minutes (e.g. <5 minutes) after IC testing is complete. This technique supports multiple fault models and has been successfully applied to a large number of samples-including ones that have been verified through failure analysis. Data is presented related to key issues such as diagnostic resolution, hardware-to-fault model correlation, diagnostic current thresholds, and the diagnosability of various defect types

Keywords

CMOS digital integrated circuits; application specific integrated circuits; automatic test software; electric current measurement; fault location; integrated circuit testing; logic testing; CMOS IC; IC testing; IDDQ diagnostic software; IDDq testing; bridging fault; defect localization; defect types; diagnostic current threshold; diagnostic resolution; failure analysis; fault localization; hardware-to-fault model correlation; multiple fault models; software-based diagnostic tools; Application software; Circuit faults; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Integrated circuit modeling; Integrated circuit testing; Logic testing; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639633

Filename

639633