Title :
Current Sensing Completion Detection in deep sub-micron technologies
Author :
Nagy, Lukas ; Stopjakova, Viera
Author_Institution :
Dept. of Microelectron., Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
Current Sensing Completion Detection (CSCD) method in asynchronous circuits is addressed. Current Sensing represents a simple but effective and reliable approach to detect completion of computation in asynchronous (self-timed) systems. However, in recent deep sub-micron technologies, several challenges, such as significant influence of process variations, leakage current power dissipation with circuit in off-state, etc., have to be faced. This paper presents an overview of these undesired effects and proposes some prospective solutions.
Keywords :
asynchronous circuits; leakage currents; asynchronous circuit system; current sensing completion detection method; deep submicron technologies; leakage current power dissipation; Asynchronous circuits; CMOS technology; Clocks; Delay; Digital circuits; Energy consumption; Leakage current; Power dissipation; Silicon; Voltage; asynchronous system; completion detection; current sensing; sub-micron technologies;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
Conference_Location :
Vienna
Print_ISBN :
978-1-4244-6612-2
DOI :
10.1109/DDECS.2010.5491799
