Title :
A new distributed optimistic concurrency control method and a comparison of its performance with two-phase locking
Author :
Thomasian, Alexander ; Rahm, Erhard
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
28 May-1 Jun 1990
Abstract :
A distributed optimistic concurrency control (OCC) method followed by locking, such that locking is an integral part of distributed validation and two-phase commit is presented. This OCC method ensures that a transaction failing its validation will not be reexecuted more than once, in general. Furthermore, deadlocks, which are difficult to handle in a distributed environment, are avoided by serializing lock requests. Implementation details are outlined, and the performance of the schemes is compared with distributed two-phase locking (2PL) through a detailed simulation, which incorporates queueing effects at the devices of the computer systems, buffer management, concurrency control, and commit processing. It is shown that in the case of higher data contention levels, the hybrid OCC method allows a much higher maximum transaction throughput than distributed 2PL. The performance of the method with respect to variable-size transactions is reported. It is shown that by restricting the number of restarts to one, the performance achieved for variable-size transactions is comparable to fixed-size transactions with the same mean size
Keywords :
concurrency control; distributed databases; transaction processing; buffer management; commit processing; deadlocks; distributed optimistic concurrency control; distributed two-phase locking; distributed validation; performance; queueing effects; restarts; transaction throughput; two-phase commit; Computational modeling; Concurrency control; Control systems; Database systems; Distributed databases; Hardware; Optimization methods; System recovery; Throughput; Transaction databases;
Conference_Titel :
Distributed Computing Systems, 1990. Proceedings., 10th International Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-2048-X
DOI :
10.1109/ICDCS.1990.89296