Title :
Functional comparison of logic designs for VLSI circuits
Author :
Berman, C.L. ; Trevillyan, L.H.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A method is described for circuit equivalence which proceeds by reducing the question of whether two circuits are equivalent to a number of a more easily answered questions concerning the equivalence of smaller, related circuits. The primary technical contribution is a technique for discovering internal equivalences and using them to show the equivalence of the outputs. The method involves the use of signatures to reduce the number of potentially equivalent signals, and the use of the min-cut algorithm to reduce the original problem to related problems with fewer independent inputs. The method can be used to extend the power of any given equivalence checking algorithm. The authors report the result of experiments evaluating their technique.<>
Keywords :
VLSI; equivalent circuits; logic CAD; VLSI circuits; circuit equivalence; equivalence checking algorithm; internal equivalences; logic designs; min-cut algorithm; Application software; Circuit testing; Combinational circuits; Data structures; Degradation; Logic circuits; Logic design; Signal design; Terminology; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-1986-4
DOI :
10.1109/ICCAD.1989.76990