Title :
Using BIST control for pattern generation
Author :
Kiefer, Gundolf ; Wunderlich, Hans-Joachim
Author_Institution :
Comput. Archit. Lab., Stuttgart Univ., Germany
Abstract :
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It takes advantage of the fact that any autonomous BIST scheme needs a BIST control unit for indicating the completion of the self-test at least. Hence, pattern counters and bit counters are always available, and they provide information to be used for deterministic pattern generation by some additional circuitry. This paper presents a systematic way for synthesizing a pattern generator which needs less area than a 32-bit LFSR for random pattern generation for all the benchmark circuits
Keywords :
automatic testing; built-in self test; design for testability; logic testing; shift registers; BILBO; BIST control; LFSR; autonomous BIST; benchmark circuits; deterministic BIST; fault coverage; hardware overhead; linear feedback shift register; pattern generator; pseudo-random BIST; random pattern generation; scan based BIST; Built-in self-test; Clocks; Linear feedback control systems; Linear feedback shift registers; Logic testing; Performance evaluation; Polynomials; Radio control; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639636
