• DocumentCode
    2743445
  • Title

    Sputtered iridium oxide films (SIROFs) for low-impedance neural stimulation and recording electrodes

  • Author

    Cogan, S.F. ; Plante, T.D. ; Ehrlich, J.

  • Author_Institution
    EIC Labs., Inc., Norwood, MA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    4153
  • Lastpage
    4156
  • Abstract
    Iridium oxide films formed by electrochemical activation of iridium metal (AIROF) or by electrochemical deposition (EIROF) are being evaluated as low-impedance charge-injection coatings for neural stimulation and recording. Iridium oxide may also be deposited by reactive sputtering from iridium metal in an oxidizing plasma. The characterization of sputtered iridium oxide films (SIROFs) as coatings for nerve electrodes is reported. SIROFs were characterized by cyclic voltammetry, electrochemical impedance spectroscopy, and potential transient measurements during charge-injection. The surface morphology of the SIROF transitions from smooth to highly nodular with increasing film thickness from 80 nm to 4600 nm. Charge-injection capacities exceed 0.75 mC/cm2 with 0.75 ms current pulses in thicker films. The SIROF was deposited on both planar and non-planar substrates and photolithographically patterned by lift-off.
  • Keywords
    biomedical electrodes; charge injection; electrochemical impedance spectroscopy; iridium compounds; neurophysiology; photolithography; sputter deposition; surface morphology; 0.75 ms; 80 to 4600 nm; IrO/sub 2/; cyclic voltammetry; electrochemical deposition; electrochemical impedance spectroscopy; electrochemical iridium metal activation; low-impedance charge-injection coatings; low-impedance neural stimulation recording; nerve electrodes; neural recording; oxidizing plasma; photolithographic patterning; potential transient measurements; sputtered iridium oxide films; surface morphology; Capacitors; Coatings; Current measurement; Electrochemical impedance spectroscopy; Electrodes; Impedance measurement; Plasma measurements; Sputtering; Substrates; Titanium; Iridium oxide; electrode; nerve; recording; sputtering; stimulation; thin-film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1404158
  • Filename
    1404158