Dual-Regulator Dual-Decoding-Trimmer DRAM Voltage Limiter For Burn-in Test

Author

Horiguchi, M. ; Aoki, M. ; Etoh, J. ; Itoh, K. ; Kajigaya, K. ; Nozoe, A. ; Matsumoto, T.

Author_Institution

Hitachi Ltd.

fYear

1991

fDate

May 30 1991-June 1 1991

Firstpage

127

Lastpage

128

Keywords

Circuit testing; Decoding; Fluctuations; Life estimation; Random access memory; Regulators; Resistors; Stress; Temperature; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on

Conference_Location

Oiso, Japan

Type

DOI

10.1109/VLSIC.1991.760111

Filename

760111

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