مرکز منطقه ای اطلاع رساني علوم و فناوري - Dual-Regulator Dual-Decoding-Trimmer DRAM Voltage Limiter For Burn-in Test

DocumentCode :

2743456

Title :

Dual-Regulator Dual-Decoding-Trimmer DRAM Voltage Limiter For Burn-in Test

Author :

Horiguchi, M. ; Aoki, M. ; Etoh, J. ; Itoh, K. ; Kajigaya, K. ; Nozoe, A. ; Matsumoto, T.

Author_Institution :

Hitachi Ltd.

fYear :

1991

fDate :

May 30 1991-June 1 1991

Firstpage :

127

Lastpage :

128

Keywords :

Circuit testing; Decoding; Fluctuations; Life estimation; Random access memory; Regulators; Resistors; Stress; Temperature; Threshold voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on

Conference_Location :

Oiso, Japan

Type :

conf

DOI :

10.1109/VLSIC.1991.760111

Filename :

760111

Link To Document :