• DocumentCode
    2743484
  • Title

    Nano-scale Metamaterials: Fabrication and Optical Measurements from THz towards visible

  • Author

    Hao, Zhao ; Martin, Michael C. ; Harteneck, Bruce ; Liddle, Alex

  • Author_Institution
    Lawrence Berkeley Nat. Lab., Berkeley
  • fYear
    2006
  • fDate
    18-22 Sept. 2006
  • Firstpage
    541
  • Lastpage
    541
  • Abstract
    We have designed, fabricated, and optically measured several different nano-scale metamaterials. We employ e-beam nano-lithography technology at LBNL´s CXRO for fabricating these structures on extremely thin SiN substrates so that they are close to free-standing. Optical properties were measured as a function of incidence angle and polarization using the ALS synchrotron IR beamlines. We directly observe strong magnetic resonances consistent with negative magnetic permeability in our samples at THz through near-IR optical frequencies. We will compare the results to detailed simulations. Finally, we will report on our progress towards constructing a negative index of refraction nano-scale metamaterial.
  • Keywords
    metamaterials; nanolithography; optical design techniques; optical fabrication; optical testing; photolithography; IR optical frequency; e-beam nanolithography technology; incidence angle; magnetic resonances; nanoscale metamaterials; negative magnetic permeability; optical measurements; polarization; Magnetic materials; Magnetic resonance; Metamaterials; Optical design; Optical device fabrication; Optical polarization; Optical refraction; Silicon compounds; Synchrotrons; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0400-2
  • Electronic_ISBN
    1-4244-0400-2
  • Type

    conf

  • DOI
    10.1109/ICIMW.2006.368749
  • Filename
    4222483