Title :
A look at the sensitivity of the Thru-Reflect-Line vector network analyzer calibration algorithm
Author :
Eiø, Christopher
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
This paper looks at the sensitivity of the Thru-Reflect-Line and Line-Reflect-Line vector network analyzer calibration algorithms to changes in their inputs. Using a consistent measurement data set throughout, it highlights differences observed in the error-corrected measurements of a DUT when interchanging line standards and the effect of small changes to the value of the length of these lines.
Keywords :
calibration; error correction; measurement errors; measurement standards; network analysers; DUT; TRL; VNA; calibration algorithm; error corrected measurement; line-reflect-line; measurement standard; thru-reflect-line; vector network analyzer; Calibration; Length measurement; Measurement uncertainty; Sensitivity; Standards; Uncertainty; Vectors; Calibration; microwave frequency; radio frequency; sensitivity; vector network analyzer;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250640
