Title :
Analysis of the residual error after nonuniformity correction for infrared focal plane array
Author :
Liu Huitong ; Wang Qi ; Chen Sihai ; Yi Xinjiang
Author_Institution :
Inst. of Opto-Electron., Harbin Inst. of Technol., China
Abstract :
A new method to calculate the residual error after nonuniformity correction (NUC) of infrared focal plane array (IRFPA) is deduced and a comparison with the past theories is performed based on a quantity of experimental data. The new method proved to be more effective. Some useful conclusions can also be deduced.
Keywords :
error analysis; focal planes; infrared detectors; IR FPA; IR focal plane array; infrared focal plane array; nonuniformity correction; residual error analysis; Error correction; Infrared detectors; Laboratories; Laser theory; Nonlinear equations; Optical arrays; Optical detectors; Optical noise; Performance analysis; Sensor arrays;
Conference_Titel :
Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6513-5
DOI :
10.1109/ICIMW.2000.893004
