A verification method for noise-temperature measurements on cryogenic low-noise amplifiers

Author

Gu, Dazhen ; Randa, James ; Billinger, Robert ; Walker, David K.

fYear

2012

fDate

1-6 July 2012

Firstpage

32

Lastpage

33

Abstract

We report a verification method for noise-temperature (NT) measurements on cryogenic low-noise amplifiers (LNAs) at liquid helium temperature. The method uses a comparison between the individual measurements of the LNA and an attenuator and the joint measurements of the tandem of the two. As a first step, we were able to determine the loss and the added NT of the cables that connected the cryogenic devices (the LNA, the attenuator, or their combination) to the test ports outside of a cryostat. The attenuator was also characterized successfully with 3% measurement uncertainty.

Keywords

attenuators; cables (electric); cryogenic electronics; cryostats; electric noise measurement; liquid helium; low noise amplifiers; measurement uncertainty; temperature measurement; NT measurement; attenuator measurement; cable; cryogenic LNA; cryogenic low-noise amplifier; cryostat; liquid helium temperature; measurement uncertainty; noise-temperature measurement; verification method; Attenuation measurement; Attenuators; Gain measurement; Loss measurement; Noise measurement; Superconducting cables; Temperature measurement; Cryogenic amplifier; measurement uncertainty; noise measurement; noise temperature; verification methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250644

Filename

6250644