DocumentCode :
2743729
Title :
A verification method for noise-temperature measurements on cryogenic low-noise amplifiers
Author :
Gu, Dazhen ; Randa, James ; Billinger, Robert ; Walker, David K.
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
32
Lastpage :
33
Abstract :
We report a verification method for noise-temperature (NT) measurements on cryogenic low-noise amplifiers (LNAs) at liquid helium temperature. The method uses a comparison between the individual measurements of the LNA and an attenuator and the joint measurements of the tandem of the two. As a first step, we were able to determine the loss and the added NT of the cables that connected the cryogenic devices (the LNA, the attenuator, or their combination) to the test ports outside of a cryostat. The attenuator was also characterized successfully with 3% measurement uncertainty.
Keywords :
attenuators; cables (electric); cryogenic electronics; cryostats; electric noise measurement; liquid helium; low noise amplifiers; measurement uncertainty; temperature measurement; NT measurement; attenuator measurement; cable; cryogenic LNA; cryogenic low-noise amplifier; cryostat; liquid helium temperature; measurement uncertainty; noise-temperature measurement; verification method; Attenuation measurement; Attenuators; Gain measurement; Loss measurement; Noise measurement; Superconducting cables; Temperature measurement; Cryogenic amplifier; measurement uncertainty; noise measurement; noise temperature; verification methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6250644
Filename :
6250644
Link To Document :
بازگشت