DocumentCode :
2743902
Title :
Characterization of Thin Films of Conjugated Polymer (BEHP-PPV) -co-(MEH-PPV) for OLEDs Aplication
Author :
Sánchez, J.C. ; Escobosa, A. ; Estrada, M.
Author_Institution :
Dept. of Electr. Eng., CINVESTAV-IPN, Mexico City
fYear :
2006
fDate :
6-8 Sept. 2006
Firstpage :
1
Lastpage :
4
Abstract :
(BEHP-PPV)-co-(MEH-PPV) is a highly soluble copolymer, more stable to photo-oxidation process than other phenyl-substituted PPV derivatives, which is appropriate to use as the active layer in organic-based light emitting devices (OLEDs). In this paper we present optical properties such as the refractive index, the extinction coefficient, and the optical gap between HOMO and LUMO levels of these polymer films, determined by absorption and photoluminescence measurements. We also show the J-V characteristics of single-layer diode structures and their relation with the injecting electrodes. It was also studied etch properties of the film looking for compatibility with photolithographic processes
Keywords :
conducting polymers; energy gap; organic light emitting diodes; organic semiconductors; photolithography; photoluminescence; polymer blends; polymer films; refractive index; semiconductor thin films; (BEHP-PPV)-co-(MEH-PPV); HOMO level; LUMO level; OLEDs; absorption measurement; active layer; conjugated polymer; extinction coefficient; highly soluble copolymer; injecting electrodes; optical gap; optical properties; organic-based light emitting devices; phenyl-substituted PPV derivatives; photo-oxidation process; photolithographic processes; photoluminescence measurement; polymer thin films; refractive index; single-layer diode structures; Extinction coefficients; Optical films; Optical polymers; Optical refraction; Optical variables control; Organic light emitting diodes; Polymer films; Refractive index; Stimulated emission; Thin film devices; (BEHP - PPV) - co - (MEH - PPV); OLEDs; Polymers; carrier tunneling; injecting electrodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineering, 2006 3rd International Conference on
Conference_Location :
Veracruz
Print_ISBN :
1-4244-0402-9
Electronic_ISBN :
1-4244-0403-7
Type :
conf
DOI :
10.1109/ICEEE.2006.251855
Filename :
4017940
Link To Document :
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