Direct comparison of Josephson Voltage Standards at 10 V between BIPM and CENAM

Author

Avilés, David ; Navarrete, Enrique ; Hernández, Dionisio ; Solve, Stéphane ; Chayramy, Régis

Author_Institution

Centro Nac. de Metrol. (CENAM), Mexico City, Mexico

fYear

2012

fDate

1-6 July 2012

Firstpage

68

Lastpage

69

Abstract

A direct comparison of Josephson Voltage Standards (JVS) at 10 V between the Bureau International des Poids et Mesures (BIPM) and the Centro Nacional de Metrología (CENAM), México, was carried out in September 2011. This comparison is part of the BIPM key comparisons (BIPM.EM-K10.b), and took place in the new DC voltage laboratory of CENAM. The relative voltage difference between the two quantum standards was -6 parts in 10¹¹ (-0.6 nV), with a relative Type A uncertainty of 4.5 parts in 10¹¹ (0.45 nV). The total combined uncertainty of the comparison is under evaluation.

Keywords

measurement standards; measurement uncertainty; voltage measurement; BIPM; Bureau International des Poids et Mesures; CENAM; Centro Nacional de Metrología; DC voltage laboratory; JVS; Josephson voltage standard; México; quantum standard; relative type A uncertainty; relative voltage difference; voltage 10 V; Detectors; Measurement uncertainty; Semiconductor device measurement; Software; Standards; Uncertainty; Voltage measurement; DC voltage measurement; DC voltage measurement standard; Josephson voltage standard; Measurement; measurement uncertainty; standards comparison;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250664

Filename

6250664