A simplified polynomial-fitting algorithm for DAC and ADC BIST

Author

Sunter, Stephen K. ; Nagi, Naveena

Author_Institution

LogicVision Inc., San Jose, CA, USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

389

Lastpage

395

Abstract

An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are translated into offset, gain, and harmonic distortion for an analog-to-digital converter (ADC) driven by a digital-to-analog converter (DAC) or other appropriate signal source. The algorithm is efficient enough to be implemented as a built-in self-test for an IC, and is particularly suitable for sigma-delta converters

Keywords

analogue-digital conversion; automatic testing; built-in self test; digital-analogue conversion; integrated circuit testing; polynomials; random processes; ADC; BIST; DAC; analog-to-digital converter; best fit line; built-in self-test; digital-to-analog converter; gain; harmonic distortion; offset; polynomial-fitting algorithm; random noise; sigma-delta converters; third order polynomial; Adders; Analog-digital conversion; Built-in self-test; Circuit noise; Circuit testing; Digital signal processing; Noise reduction; Operational amplifiers; Polynomials; Signal processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639641

Filename

639641