Title :
A simplified polynomial-fitting algorithm for DAC and ADC BIST
Author :
Sunter, Stephen K. ; Nagi, Naveena
Author_Institution :
LogicVision Inc., San Jose, CA, USA
Abstract :
An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are translated into offset, gain, and harmonic distortion for an analog-to-digital converter (ADC) driven by a digital-to-analog converter (DAC) or other appropriate signal source. The algorithm is efficient enough to be implemented as a built-in self-test for an IC, and is particularly suitable for sigma-delta converters
Keywords :
analogue-digital conversion; automatic testing; built-in self test; digital-analogue conversion; integrated circuit testing; polynomials; random processes; ADC; BIST; DAC; analog-to-digital converter; best fit line; built-in self-test; digital-to-analog converter; gain; harmonic distortion; offset; polynomial-fitting algorithm; random noise; sigma-delta converters; third order polynomial; Adders; Analog-digital conversion; Built-in self-test; Circuit noise; Circuit testing; Digital signal processing; Noise reduction; Operational amplifiers; Polynomials; Signal processing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639641
