DocumentCode :
2744539
Title :
Reviewers
fYear :
2010
fDate :
22-27 Aug. 2010
Abstract :
The publication offers a note of thanks and lists its reviewers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in System Testing and Validation Lifecycle (VALID), 2010 Second International Conference on
Conference_Location :
Nice
Print_ISBN :
978-1-4244-7784-5
Type :
conf
DOI :
10.1109/VALID.2010.6
Filename :
5614897
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2744539
