Title :
Application of Support System for Double Cantilever Piles in Deep Foundation Pit
Author :
Qi, Su ; Ding, Daming ; Chen, Xingxing ; He, Shuiming ; Lu, Weina ; Ming, Lei
Author_Institution :
Fac. of Eng., China Univ. of Geosci., Wuhan, China
Abstract :
At present, there is used soil mechanics principle to carry on the computation, and regard as the rigid frame to the double piling´s analysis method to analysis the double piles, but this method did not reflect the System in force supporting the mechanism. The depth excavation is often larger and different from ordinary frame for the deep foundation pit construction, because the connection of two rows of bored piles of the crown stiffness much smaller than the pile, therefore, it cannot be regarded as rigid frame. Because it exceptionally complex stress mechanism brings very major difficulty to the supports and protections system design, so the force must be used close actual stress condition the short-cut method to carry on the analysis to its stress mechanism. According to the characteristics of deep excavation, using the relevant theoretical knowledge, the double cantilever pile of deep foundation pit bracing system design methods and construction technology were put forward in this paper. Through the application of practical project, deep excavation of the security has been ensured, and the effect was very well.
Keywords :
cantilevers; design engineering; excavators; foundations; geotechnical engineering; maintenance engineering; soil; structural engineering; bracing system design methods; crown stiffness; deep excavation; deep foundation pit construction; double cantilever piles; protection system design; soil mechanics; support system; Control systems; Force control; Helium; Immune system; Industrial engineering; Protection; Soil; Space technology; Stress; System analysis and design; Cantilevered double-row piles; Construction echnology; Deep foundation pit; Design; Support system;
Conference_Titel :
Computing, Control and Industrial Engineering (CCIE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-0-7695-4026-9
DOI :
10.1109/CCIE.2010.224