DocumentCode :
2745004
Title :
A waveguide bridge/quasi-optical W-band spectrometer for dielectric measurement of absorbing materials
Author :
Afsar, M.N. ; Tkachov, I.I. ; Kocharyan, K.N.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
fYear :
2000
fDate :
12-15 Sept. 2000
Firstpage :
393
Lastpage :
394
Abstract :
A spectrometer system is designed and constructed for the precision measurement of dielectric permittivity and loss tangent of absorbing materials. The new instrument is capable of providing the high resolution data for the first time over an extended W-band (68-118 GHz) frequencies for specimens with large range of absorption values, including highly absorbing specimens which otherwise would not be possible. The technique is based on the unbalanced bridge which is developed for the measurement of the phase of the wave passed through the specimen in free space (quasi-optical) with reference provided by a waveguide arm. Precision waveguide and quasi-optical components allowed reliable broad band operation. A number of common dielectrics are measured and data for the real and imaginary parts of dielectric permittivity are presented.
Keywords :
dielectric loss measurement; dielectric losses; microwave spectra; millimetre wave spectra; millimetre wave spectroscopy; permittivity; permittivity measurement; 68 to 118 GHz; absorbing materials; dielectric measurement; dielectric permittivity; extended W-band; free space; loss tangent; waveguide bridge/quasi-optical W-band spectrometer; Bridges; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Instruments; Loss measurement; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6513-5
Type :
conf
DOI :
10.1109/ICIMW.2000.893075
Filename :
893075
Link To Document :
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