DocumentCode :
2745477
Title :
Negative Bias Temperature Instability In Poly-Si TFTs
Author :
Maeda, S. ; Maegawa, S. ; Ipposhi, T. ; Nishimura, H. ; Ichiki, T. ; Mitsubashi ; Ashida, M. ; Muragishi, T. ; Nishimura, T.
Author_Institution :
LSI Laboratory Mitsubishi Electric Corporation
fYear :
1993
fDate :
17-19 May 1993
Firstpage :
29
Lastpage :
30
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIT.1993.760229
Filename :
760229
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2745477
