DocumentCode :
2745548
Title :
Effects of the velocity-saturated region on MOSFET scaling
Author :
Takeuchi, K. ; Fukuma, M.
Author_Institution :
NEC Corporation
fYear :
1993
fDate :
17-19 May 1993
Firstpage :
37
Lastpage :
38
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIT.1993.760233
Filename :
760233
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2745548
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