DocumentCode

2745571

Title

Experimental Study Of Threshold Voltage Fluctuations Using An 8k MOSFET´s Array

Author

Mizuno, T. ; Okamura, J. ; Toriumi, A.

Author_Institution

Toshiba Corporation

fYear

1993

fDate

17-19 May 1993

Firstpage

41

Lastpage

42

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIT.1993.760235

Filename

760235