Title :
Analysis and Research to Security Testing of Smart Card
Author :
Yuchuan, Wu ; Yaqin, Sun
Author_Institution :
Electron & Inf. Eng. Inst., Wuhan Univ. of Sci. & Eng., Wuhan, China
Abstract :
This paper gives some methods of testing the security of smart card by analyzing the characteristic of Java card and developing method of applet. It also analyzes and compares their principle and security testing way. It benefits developing security testing tool for Java card further on theory and method.
Keywords :
Java; security of data; smart cards; Java card; security testing; smart card; Application software; Buffer storage; Computational modeling; Hardware; Information security; Java; Runtime environment; Smart cards; Testing; Virtual machining; Research; analysis; smart card;
Conference_Titel :
Electronic Commerce and Business Intelligence, 2009. ECBI 2009. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-3661-3
DOI :
10.1109/ECBI.2009.66
