DocumentCode
2745760
Title
Long-term depression is reliably induced in rats at 30 days of age
Author
Blaise, J. Harry
Author_Institution
Dept. of Eng., Trinity Coll., Hartford, CT, USA
Volume
2
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
4600
Lastpage
4602
Abstract
Previously we showed that long-term depression (LTD, a lasting diminishment in synaptic strength) can be reliably induced in the hippocampal dentate gyrus of both adult and 2-week old freely moving rats. Results from these studies indicated both age- and frequency-dependent alterations in the frequency response profile of the perforant path/dentate gyrus synapse. In the present study, we designed experiments to assess whether these frequency-response changes are sustained over the extent of time spanning the perinatal period and early adulthood. Dentate evoked field potentials were recorded and analyzed using the population spike amplitude (PSA) measure following sustained stimulation (900 pulses) of the lateral perforant pathway at various frequencies. Preliminary results suggest that LTD can reliably be induced in the 30-day old freely moving rat, and that such LTD is frequency dependent. These preliminary results, although representative of only 5 animals, appear to be consistent with our previously published findings of frequency and age effects on LTD transition to long-term potentiation (LTP) in the freely moving rat model.
Keywords
bioelectric potentials; brain; medical signal processing; neurophysiology; 2 week; 30 day; dentate evoked field potentials; freely moving rats; hippocampal dentate gyrus; long-term depression; long-term potentiation; perforant path/dentate gyrus synapse; population spike amplitude; synaptic strength; Animals; Educational institutions; Electrodes; Frequency dependence; Frequency measurement; Frequency response; Pulse measurements; Rats; Reliability engineering; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1404275
Filename
1404275
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