Title :
Two test data selection strategies towards testing of Boolean specifications
Author :
Chen, T.Y. ; Lau, M.F.
Author_Institution :
Dept. of Comput. Sci., Melbourne Univ., Parkville, Vic., Australia
Abstract :
Test data selection for software represented as Boolean formulae has not received much attention until the last decade. Most of the approaches are expression driven because generation of test cases is based on the Boolean formulae being tested. The paper discusses test data generation using a fault based approach in the sense that generation of test cases is based on particular types of faults occurring in the Boolean expression. Two special types of faults are considered. Moreover, two strategies of test case selection that guarantee the detection of these two types of faults are proposed
Keywords :
Boolean algebra; formal specification; program testing; Boolean expression; Boolean formulae; Boolean specification testing; Boolean testing; fault based approach; test case selection; test data generation; test data selection strategies; Automatic testing; Boolean functions; Computer science; Equations; Fault detection; Software testing; Terminology;
Conference_Titel :
Computer Software and Applications Conference, 1997. COMPSAC '97. Proceedings., The Twenty-First Annual International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-8105-5
DOI :
10.1109/CMPSAC.1997.625080