DocumentCode

2745892

Title

New Mechanism For Bipolar Degradation In Sub-micron BiCMOS

Author

Bude, J. ; Kizilyalli, I.C.

Author_Institution

AT&T Bell Laboratories

fYear

1993

fDate

17-19 May 1993

Firstpage

79

Lastpage

80

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIT.1993.760254

Filename

760254