Title :
New Mechanism For Bipolar Degradation In Sub-micron BiCMOS
Author :
Bude, J. ; Kizilyalli, I.C.
Author_Institution :
AT&T Bell Laboratories
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIT.1993.760254
