Title :
Suppressing Flash EEPROM Erase Leakage With Negative Gate Bias And LDD Erase Junction
Author :
Hsing-jen Wann ; Parke, S.A. ; Ko, P.K. ; Chenming Hu
Author_Institution :
University of California
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIT.1993.760255
