DocumentCode

2745922

Title

Suppressing Flash EEPROM Erase Leakage With Negative Gate Bias And LDD Erase Junction

Author

Hsing-jen Wann ; Parke, S.A. ; Ko, P.K. ; Chenming Hu

Author_Institution

University of California

fYear

1993

fDate

17-19 May 1993

Firstpage

81

Lastpage

82

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIT.1993.760255

Filename

760255