Title :
High Performance 0.1/spl mu/m nMOSFET´s with 10 ps/stage Delay (85 K) at 1.5 V Power Supply
Author :
Mii, Y. ; Rishton, S. ; Taur, Y. ; Kern, D. ; Lii, T. ; Lee, K. ; Jenkins, K. ; Qunilan ; Brown, T. ; Danner, D. ; Sewell, F. ; Polcari, M.
Author_Institution :
IBM T.J. Watson Research Center
Abstract :
Very high performance 0.1 /spl mu/m nMOSFETs are fabricated with 3.5 nm gate oxide and shallow arsenic/boron (halo) source-drain extension. A 10 ps/stage della is recorded at 85 K from a 0.08 pm channel ring osMlator, which is the fastest switching speed ever re- ported for any silicon device. The delay at room temper- ature is 13 ps/stage. Unity-current-gain frequency cutoffs (f/sub r/) of a 0.09 /spl mu/m channel device are 119 GHz at 85 K and 93 GHz at 300 K. Record high saturation transconductances, 1040 mSImm at 85 K and 740 mS/MM at 300 K , are obtained from a 0.05 /spl mu/m channel device. Good subthreshold characteristics are achieved for 0.1 /spl mu/m channel devices.
Keywords :
Cutoff frequency; Delays; Logic gates; MOSFET; Performance evaluation; Power supplies; Ring oscillators;
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIT.1993.760260