• DocumentCode
    2746048
  • Title

    The effects of the degree of cure of anisotropic conductive films (ACFs) on the contraction stress build-up of ACFs and ACF joints stability for ACF flip-chip interconnection

  • Author

    Chung, Chang-Kyu ; Paik, Kyung-Wook

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci.&Technol., Daejeon
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    In this paper, the effects of the degree of cure of an Anisotropic Conductive Film (ACF) on the material properties and the contraction stress build-up of the ACF and ACF joints stability were investigated. The degrees of cure of the ACF as a function of bonding times were quantitatively obtained by a dynamic DSC study and an Attenuated Total Reflectance/Fourier transform infrared (ATR/FT-IR) analysis. According to the results, the thickness expansion rate of the ACF as a function of temperature decreased and the storage modulus increased as the degree of cure increased. In addition, the contraction stress of partially cured ACF with the degree of cure below 40% was much smaller than that of fully cured ACF. The ACF contact resistances decreased and the ACF peel adhesion strengths increased as the degree of cure of the ACF increased. In particular, the ACF rebound resulting in poor electrical contact was observed when the degree of cure was below 40%. Furthermore, the ACF joints with the degree of cure below 40% were more unstable than those with the degree of cure over 90% during 85degC and 85% relative humidity test (85degC/85% RH).
  • Keywords
    Fourier transform spectra; adhesion; attenuated total reflection; contact resistance; curing; differential scanning calorimetry; elastic moduli; flip-chip devices; humidity; integrated circuit interconnections; joining materials; stability; stress effects; thin films; DSC; Fourier transform infrared analysis; anisotropic conductive films; attenuated total reflectance; bonding times; contact resistance; contraction stress build-up; cure degree; electrical contact; flip-chip interconnection; joints stability; peel adhesion strengths; relative humidity; storage modulus; temperature 85 degC; thickness expansion rate; Adhesives; Anisotropic conductive films; Bonding; Contacts; Fourier transforms; Material properties; Reflectivity; Stability; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784219
  • Filename
    4784219