Title :
Alloying design of Sn-Ag-Cu solders for the improvement in drop test performance
Author :
Lin, Li-Wei ; Song, Jenn-Ming ; Lai, Yi-Shao ; Chiu, Ying-Ta ; Lee, Ning-Cheng
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
Abstract :
In addition to a reduced Ag content, it has been demonstrated that significant improvement of drop test performance of Sn-Ag-Cu solder joints can be achieved by alloying with Mn and Ti. This study aims to investigate the effects of Mn and Ti additives on the microstructure and solidification behavior of Sn-1.0Ag-0.5Cu alloys, as well as mechanical properties and thus to explain how the alloying elements affect drop test results. Results show that alloying of Mn and Ti results in coarse eutectic structure and greater amount of pro eutectic Sn of which the size was refined. The microstructural changes leads to a reduction in elastic modulus, which plays an important role for the enhancement of drop impact reliability. However, there exists an optimal value for the alloying content, since excess addition of Mn or Ti gives rise to the formation of massive intermetallic compounds (IMCs), MnSn2 and Ti2Sn3. Those heterogeneous IMCs are harder than the inherent IMCs, Ag3Sn and Cu6Sn5, according to the nanoindentation results and may cause the degradation in drop performance.
Keywords :
copper alloys; crystal microstructure; elastic moduli; materials testing; silver alloys; solders; solidification; tin alloys; Sn-Ag-Cu; Sn-Ag-Cu solders; additives; alloying design; degradation; drop test performance; elastic modulus; eutectic structure; massive intermetallic compounds; mechanical properties; microstructure; nanoindentation; solder joints; solidification; Additives; Alloying; Lead; Manganese alloys; Mechanical factors; Microstructure; Soldering; Testing; Tin; Titanium alloys; Sn-Ag-Cu; damping capacity; nanoindentation; tensile properties; transition metals;
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
DOI :
10.1109/EMAP.2008.4784222