DocumentCode
2746277
Title
Parasitic effect removal for analog measurement in P1149.4 environment
Author
Su, Chauchin ; Chen, Yue-Tsang ; Jou, Shyh-Jye
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
fYear
1997
fDate
1-6 Nov 1997
Firstpage
499
Lastpage
508
Abstract
An intrinsic response extraction algorithm is derived and implemented to remove the parasitic effects in P1149.4 analog measurement. The methodology is tested on and verified by SPICE simulation results and real measurement data
Keywords
IEEE standards; SPICE; analogue circuits; automatic test equipment; automatic testing; design for testability; digital simulation; electronic equipment testing; P1149.4 analog measurement; P1149.4 environment; SPICE simulation; analog measurement; intrinsic response extraction algorithm; parasitic effect removal; real measurement data; Circuit faults; Circuit testing; Cutoff frequency; Data mining; Design for testability; Electrical resistance measurement; Electronic equipment testing; Nonlinear distortion; SPICE; Standardization;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639656
Filename
639656
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