Title :
Parasitic effect removal for analog measurement in P1149.4 environment
Author :
Su, Chauchin ; Chen, Yue-Tsang ; Jou, Shyh-Jye
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Abstract :
An intrinsic response extraction algorithm is derived and implemented to remove the parasitic effects in P1149.4 analog measurement. The methodology is tested on and verified by SPICE simulation results and real measurement data
Keywords :
IEEE standards; SPICE; analogue circuits; automatic test equipment; automatic testing; design for testability; digital simulation; electronic equipment testing; P1149.4 analog measurement; P1149.4 environment; SPICE simulation; analog measurement; intrinsic response extraction algorithm; parasitic effect removal; real measurement data; Circuit faults; Circuit testing; Cutoff frequency; Data mining; Design for testability; Electrical resistance measurement; Electronic equipment testing; Nonlinear distortion; SPICE; Standardization;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639656
