DocumentCode :
2746301
Title :
Deep Sub-Micron CMOS (/spl mu/m CMOS: RT or Cryo-, 0.25/spl mu/m pMOS: Buried or Surface Channel?)
Author :
Kakumu ; Zetterlund, B.
Author_Institution :
Toshiba
fYear :
1993
fDate :
17-19 May 1993
Firstpage :
119
Lastpage :
119
Abstract :
Summary form only given. Scaling MOS devices has provided high performance, high density CMOS LSIs, such as memories and microprocessors, and scaling remains the key to obtaining better performance in the future. This session will examine deep sub-micron CMOS technologies from the point of view of device design, process technology, circuit performance, reliability and integratability.
Keywords :
CMOS integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIT.1993.760276
Filename :
760276
Link To Document :
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