DocumentCode
2746317
Title
CVD Of Copper From A Cu+1 Precursor And Water Vapor And Formation Of TiN- Encapsulated Submicron Copper Interconnects By Chemical-Mechanical Polishing
Author
Gelatos ; Poon, S. ; Marsh, R. ; Mogab, C.J. ; Thompson, M.
Author_Institution
Motorola Inc.
fYear
1993
fDate
17-19 May 1993
Firstpage
123
Lastpage
124
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location
Kyoto, Japan
Type
conf
DOI
10.1109/VLSIT.1993.760279
Filename
760279
Link To Document