Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure

Author

da Silva, Jose Machado ; Leão, Ana C. ; Alves, José C. ; Matos, José Silva

Author_Institution

Fac. de Engenharia, Porto Univ., Portugal

fYear

1997

fDate

1-6 Nov 1997

Firstpage

509

Lastpage

517

Abstract

The development of a mixed-signal test bus infrastructure-IEEE P1149.4-is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros

Keywords

IEEE standards; electric current measurement; integrated circuit testing; mixed analogue-digital integrated circuits; standardisation; voltage measurement; IEEE P1149.4 infrastructure; P1149.4 working group; alternative testing methods; analog boundary module; analog macros; correlation; mixed current/voltage technique; mixed current/voltage testing; mixed-signal macros; mixed-signal test bus infrastructure; monitoring; parametric testing; passive components; power supply current; standardization; testing; Circuit testing; Current supplies; Electronic equipment testing; Integrated circuit testing; Logic; Performance evaluation; Power supplies; Standardization; Switches; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639657

Filename

639657