Title :
RFID implementation in inventory management of wafer cassettes and probe cards in wafer testing houses
Author :
Lee, Michael ; Huang, C.F. ; Liu, An-Hong ; Yi-Chang Lee
Author_Institution :
ChipMOS Technol. Inc., Tainan
Abstract :
Wafers, wafer cassettes, and probe cards are critical assets for wafer testing houses. Any mistake will cause tremendous damage to wafer owners and to the testing houses. These assets shall be carefully stocked in stocking facilities such as stockers, nitrogen cabinets, trolleys, and testers with a reliable tracking system which can provide accurate and real-time inventory information. To register the individual locations of the assets, the most popular technology implemented today is the Barcode systems. Barcode is mature, stable, cost-effective, and widely implemented in various applications. However, Barcode is not fully automatic nor real-time, nor 100% accurate due to the possibility of human errors. A revolutionary technology of Radio Frequency Identification (RFID) is implemented to resolve these problems to achieve 100% accurate inventory information with real-time and automatic acquisition of asset locations.
Keywords :
bar codes; integrated circuit testing; inventory management; radiofrequency identification; RFID; barcode; inventory management; probe cards; radio frequency identification; wafer cassettes; wafer testing houses; Inventory management; Probes; Radiofrequency identification; Testing; RFID; Wafers; ZigBee; probe card; wafer cassette;
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
DOI :
10.1109/EMAP.2008.4784242