• DocumentCode
    2746612
  • Title

    High-performance Marchand-type balun design and fabrication using an integrated passives device (IPD) technology

  • Author

    Huang, Chien-Hsiang ; Wei, Tzu-Chiang ; Horng, Tzyy-Sheng ; Wu, Sung-Mao ; Wang, Chen-Chao ; Chiu, Chi-Tsung ; Hung, Chih-Pin

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    The integrated passive device (IPD) technology was currently developed for high performance, small volume or size, low cost and multi-functional integration for wireless RF front-end applications. Especially wafer level packaging technologies offer an interesting variety of different possibilities for the implementation of integrated passive components. The IPD process is made by a low-cost manufacturing technology and a high-performance process technology of electro-chemically forming spin coating layer on glass wafer and processing thick-Cu interconnects and polyimide dielectrics. In this paper, an integrated Marchand-type balun for 2.45-GHz WLAN applications is presented and exhibit excellent measured performance with insertion loss of 1 dB. The measured amplitude balance and phase balance of 0.45 dB and 3 degree, and common mode rejection ratio of 28 dB were realized. Finally, EM simulation and experimental verification show very good agreement between simulated and measured results by validating IPD design process.
  • Keywords
    UHF devices; baluns; coplanar waveguides; wafer level packaging; wireless LAN; EM simulation; WLAN applications; coplanar waveguide; copper interconnects; frequency 2.45 GHz; glass wafer; high-performance Marchand-type balun design; integrated passives device technology; loss 1 dB; low-cost manufacturing technology; multifunctional integration; polyimide dielectrics; wafer level packaging technology; wireless RF front-end applications; Coatings; Components, packaging, and manufacturing technology; Costs; Dielectric measurements; Fabrication; Glass manufacturing; Impedance matching; Manufacturing processes; Radio frequency; Wafer scale integration; Integrated Passive Device; Marchand Balun; spiral transmission line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784248
  • Filename
    4784248