Title :
Analysis of flip-chip corner delamination using 3-D virtual crack closure technique
Author :
Chiu, Tz-Cheng ; Lin, Huang-Chun ; Yang, Hung-Chun
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
The problem of an overmolded flip-chip containing a die-underfill interface corner crack subjected to thermo-mechanical loading is investigated by using finite element simulation. The fracture mechanics parameters including the stress intensity factors and strain energy release rate along the corner crack front are determined by using a three-dimensional virtual crack closure technique. Effect of the interface corner crack shape on the propensity of crack propagation is discussed.
Keywords :
cracks; delamination; finite element analysis; flip-chip devices; fracture mechanics; 3-D virtual crack closure technique; crack propagation; finite element simulation; flip-chip corner delamination; fracture mechanics; interface corner crack shape; strain energy release rate; stress intensity factors; three-dimensional virtual crack closure technique; Capacitive sensors; Delamination; Equations; Finite element methods; Mechanical engineering; Packaging; Shape; Silicon; Thermal stresses; Thermomechanical processes;
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
DOI :
10.1109/EMAP.2008.4784253