• DocumentCode
    2746713
  • Title

    Physical limitations on frequency and power parameters of transistors

  • Author

    Johnson, Eric

  • Author_Institution
    RCA Electronic Components and Devices, Somerville, NJ, USA
  • Volume
    13
  • fYear
    1966
  • fDate
    21-25 March 1966
  • Firstpage
    27
  • Lastpage
    34
  • Abstract
    A simple analysis shows that the ultimate performance limits of a transistor are set by the product Ev_{s}/2\\pi , where E is the semiconductor\´s dielectric breakdown strength and v_{s} is its minority carrier saturated drift velocity. This product, having a value of about 2 \\times 10^{11} volts/ second for silicon, emphasizes that a semiconductor material has a maximum capability for energizing the electric charges that process a signal. If the device operating frequency is high, the frequency time period is short and only a small amount of energy can be given to a charge carrier. Consequently, the power and power amplification must be relatively low. At low frequencies the inverse is true. That is, device physics demands an inverse relation between frequency and power parameters that is independent of the thermal dissipation arguments commonly given to explain the trade-off between these parameters. The analysis leads to an effective means for making comparisons between existing devices. This is illustrated.
  • Keywords
    Charge carriers; Cutoff frequency; Dielectric breakdown; Electron mobility; Electronic components; Joining processes; Performance analysis; Semiconductor materials; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    1958 IRE International Convention Record
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/IRECON.1965.1147520
  • Filename
    1147520