DocumentCode
2746713
Title
Physical limitations on frequency and power parameters of transistors
Author
Johnson, Eric
Author_Institution
RCA Electronic Components and Devices, Somerville, NJ, USA
Volume
13
fYear
1966
fDate
21-25 March 1966
Firstpage
27
Lastpage
34
Abstract
A simple analysis shows that the ultimate performance limits of a transistor are set by the product
, where
is the semiconductor\´s dielectric breakdown strength and
is its minority carrier saturated drift velocity. This product, having a value of about
volts/ second for silicon, emphasizes that a semiconductor material has a maximum capability for energizing the electric charges that process a signal. If the device operating frequency is high, the frequency time period is short and only a small amount of energy can be given to a charge carrier. Consequently, the power and power amplification must be relatively low. At low frequencies the inverse is true. That is, device physics demands an inverse relation between frequency and power parameters that is independent of the thermal dissipation arguments commonly given to explain the trade-off between these parameters. The analysis leads to an effective means for making comparisons between existing devices. This is illustrated.
, where
is the semiconductor\´s dielectric breakdown strength and
is its minority carrier saturated drift velocity. This product, having a value of about
volts/ second for silicon, emphasizes that a semiconductor material has a maximum capability for energizing the electric charges that process a signal. If the device operating frequency is high, the frequency time period is short and only a small amount of energy can be given to a charge carrier. Consequently, the power and power amplification must be relatively low. At low frequencies the inverse is true. That is, device physics demands an inverse relation between frequency and power parameters that is independent of the thermal dissipation arguments commonly given to explain the trade-off between these parameters. The analysis leads to an effective means for making comparisons between existing devices. This is illustrated.Keywords
Charge carriers; Cutoff frequency; Dielectric breakdown; Electron mobility; Electronic components; Joining processes; Performance analysis; Semiconductor materials; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
1958 IRE International Convention Record
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/IRECON.1965.1147520
Filename
1147520
Link To Document