DocumentCode :
2746713
Title :
Physical limitations on frequency and power parameters of transistors
Author :
Johnson, Eric
Author_Institution :
RCA Electronic Components and Devices, Somerville, NJ, USA
Volume :
13
fYear :
1966
fDate :
21-25 March 1966
Firstpage :
27
Lastpage :
34
Abstract :
A simple analysis shows that the ultimate performance limits of a transistor are set by the product Ev_{s}/2\\pi , where E is the semiconductor\´s dielectric breakdown strength and v_{s} is its minority carrier saturated drift velocity. This product, having a value of about 2 \\times 10^{11} volts/ second for silicon, emphasizes that a semiconductor material has a maximum capability for energizing the electric charges that process a signal. If the device operating frequency is high, the frequency time period is short and only a small amount of energy can be given to a charge carrier. Consequently, the power and power amplification must be relatively low. At low frequencies the inverse is true. That is, device physics demands an inverse relation between frequency and power parameters that is independent of the thermal dissipation arguments commonly given to explain the trade-off between these parameters. The analysis leads to an effective means for making comparisons between existing devices. This is illustrated.
Keywords :
Charge carriers; Cutoff frequency; Dielectric breakdown; Electron mobility; Electronic components; Joining processes; Performance analysis; Semiconductor materials; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1958 IRE International Convention Record
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/IRECON.1965.1147520
Filename :
1147520
Link To Document :
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