DocumentCode :
2746815
Title :
Influence of lanthanum addition on microstructure and properties of Sn-3.5Ag solder system
Author :
Lee, Hwa-Teng ; Chen, Yin-Fa ; Hong, Ting-Fu ; Huang, Yu-Jing
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
183
Lastpage :
186
Abstract :
The goal of this research is to evaluate the effects of La addition on the microstructure and microhardness of Sn-Ag based solders. Sn-3.5Ag-xLa ternary alloy solder were prepared by adding 0-1.0 wt% La into a Sn-3.5Ag alloy. Copper substrates were then dipped into these solders and aged at 150degC for up to 625 hours. The microstructure and microhardness of the as solidified solder and the aged solder/copper couples were investigated. Experimental results show that Sn-3.5Ag-xLa solders are composed of beta-Sn, Ag3Sn and LaSn3 phases, and their microstructure is refined with La addition. After isothermal aging, Ag3Sn and IMC layer can be effectively depressed by adding a small amount of La element, and the size and amount of LaSn3 compounds did not change perceptibly with storage time. The addition of La increased the microhardness of the Sn-Ag solder due to the refining effect of Ag3Sn particles in eutectic and increased formation of LaSn3 compound. After isothermal storage, the microhardness of solders was decreased with the increasing coarsening of Ag3Sn compounds as aging time was increased. However, coarsening of Ag3Sn compounds was retarded by La addition as revealed in this study. Therefore, La addition helped to improve the microhardness and thermal resistance of the solder joints.
Keywords :
ageing; alloying additions; eutectic structure; lanthanum alloys; microhardness; silver alloys; solders; solidification; thermal resistance; tin alloys; Ag3Sn; LaSn3; SnAgLa; aged solder-copper couples; ageing; coarsening; copper substrates; eutectic state; isothermal aging; lanthanum addition; microhardness; microstructure; refining effect; solidified solder; temperature 150 degC; ternary alloy solder; thermal resistance; time 625 h; Aging; Copper; Lanthanum; Mechanical engineering; Mechanical factors; Microstructure; Optical materials; Optical microscopy; Soldering; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
Type :
conf
DOI :
10.1109/EMAP.2008.4784259
Filename :
4784259
Link To Document :
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