DocumentCode :
2746830
Title :
Size and substrate effects on microstructure and shear properties of solder joints
Author :
Lee, Gwo-Wei ; Song, Jenn-Ming ; Yi-Shao Lai ; Chiu, Ying-Ta ; Su, Chien-Wei
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Dong Hwa Univ., Hualien
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
187
Lastpage :
190
Abstract :
Considering that the mechanical behavior plays a very important role in the packaging reliability, this study examined the shear deformation properties of pure Sn joints with different substrate materials and various gap sizes. The proeutectic Sn dendrites were refined and the shear strength was increased with a shrunken sample gap. The interfacial intermetallic compounds (IMCs) were thickened slightly when the sample gap was less than 100 mum. A decrease in joint thickness transformed the fracture paths of the Cu/Sn/Cu samples from solder bulk to the boundary between interfacial IMC and the solder. As for the Cu/Sn/Ni sandwich structured joints, they exhibited an asymmetrical structure which resulted from the interaction of substrate elements and thus inferior shear strength compared to the Cu/Sn/Cu samples with the same thickness, as well as the difference in fracture mode.
Keywords :
chemical interdiffusion; copper; dendrites; dendritic structure; eutectic structure; fracture; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; nickel; shear deformation; shear strength; solders; tin; Cu-Sn-Cu; Cu-Sn-Ni; IC packaging; asymmetrical structure; fracture mode; gap size; interfacial intermetallic compounds; microelectronic interconnections; packaging reliability; proeutectic dendrites; sandwich structured joint; shear deformation; shear strength; solder; solder joint microstructure; Bars; Flip chip; Intermetallic; Joining materials; Mechanical factors; Microstructure; Reliability engineering; Soldering; Substrates; Tin; shear deformation; size effect; solder joint; substrate effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
Type :
conf
DOI :
10.1109/EMAP.2008.4784260
Filename :
4784260
Link To Document :
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