Differential sampling measurement of a 7 V rms sine wave and a programmable Josephson voltage standard

Author

Rüfenacht, Alain ; Burroughs, Charles J. ; Benz, Samuel P. ; Dresselhaus, Paul D.

Author_Institution

Nat. Inst. of Stand. & Technol. NIST, Boulder, CO, USA

fYear

2012

fDate

1-6 July 2012

Firstpage

174

Lastpage

175

Abstract

A 10 V programmable Josephson voltage standard has enabled sine waves with rms voltages up to 7 V to be accurately measured with differential sampling methods. This paper reviews the challenges and limitations of differential sampling that arise when rms voltages greater than a few volts are measured. Preliminary measurements confirmed the capability of the NIST 10 V Josephson array to perform this task and emphasize the need for highly stable and low-phase-noise ac sine wave voltage sources in order to further reduce the measurement uncertainty¹.

Keywords

Josephson effect; differential equations; measurement uncertainty; sampling methods; voltage measurement; NIST Josephson array; low-phase-noise AC sine wave voltage sources; measurement uncertainty¹; programmable Josephson voltage standard; sine wave differential sampling measurement; voltage 10 V; voltage 7 V; Apertures; Measurement uncertainty; NIST; Sampling methods; Voltage measurement; Voltmeters; Differential amplifiers; Josephson arrays; digital-analog conversion; standards; voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250857

Filename

6250857