Title :
Differential sampling measurement of a 7 V rms sine wave and a programmable Josephson voltage standard
Author :
Rüfenacht, Alain ; Burroughs, Charles J. ; Benz, Samuel P. ; Dresselhaus, Paul D.
Author_Institution :
Nat. Inst. of Stand. & Technol. NIST, Boulder, CO, USA
Abstract :
A 10 V programmable Josephson voltage standard has enabled sine waves with rms voltages up to 7 V to be accurately measured with differential sampling methods. This paper reviews the challenges and limitations of differential sampling that arise when rms voltages greater than a few volts are measured. Preliminary measurements confirmed the capability of the NIST 10 V Josephson array to perform this task and emphasize the need for highly stable and low-phase-noise ac sine wave voltage sources in order to further reduce the measurement uncertainty1.
Keywords :
Josephson effect; differential equations; measurement uncertainty; sampling methods; voltage measurement; NIST Josephson array; low-phase-noise AC sine wave voltage sources; measurement uncertainty1; programmable Josephson voltage standard; sine wave differential sampling measurement; voltage 10 V; voltage 7 V; Apertures; Measurement uncertainty; NIST; Sampling methods; Voltage measurement; Voltmeters; Differential amplifiers; Josephson arrays; digital-analog conversion; standards; voltage measurement;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250857