Title :
Flat frequency response in the electronic measurement of the Boltzmann constant
Author :
Qu, Jifeng ; Benz, Samuel P. ; Fu, Yunfeng ; Zhang, Jianqiang ; Rogalla, Horst ; Pollarolo, Alessio
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
A new quantum voltage calibrated Johnson noise thermometer (JNT) was developed at NIM to demonstrate the electrical approach that determines the Boltzmann constant k by comparing electrical and thermal noise power. A measurement with an integration period of 10 hours and bandwidth of 640 kHz results in relative offset of 0.5×10-6 from the current CODATA value of k, and type A relative standard uncertainty of 23×10-6. The quadratic fitting parameters of the ratio spectrum show a flat response with respect to the measurement bandwidth. This flat response is a dramatic improvement compared to the response produced by the NIST JNT system that dominated the relative combined uncertainty of previous measurements of k.
Keywords :
calibration; constants; frequency response; thermal noise; thermometers; Boltzmann constant k; CODATA; Johnson noise thermometer; NIM; NIST JNT system; bandwidth 640 kHz; calibration; electrical noise power; electronic measurement; flat frequency response; quadratic fitting parameters; ratio spectrum; relative standard uncertainty; thermal noise power; Bandwidth; Fitting; Frequency measurement; Measurement uncertainty; Noise; Transmission line measurements; Uncertainty; Boltzmann constant; Correlation; Josephson junction arrays; Noise; Quantization; Thermometry;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250879