• DocumentCode
    2747299
  • Title

    The microstructure and fracture behavior of Sn-3Ag-0.5Cu solder joints

  • Author

    Wang, T.S. ; Liu, S.C. ; Huang, Y.L. ; Lin, K.L. ; Lai, Y.S.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Cheng Kung Univ., Tainan
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    Ball impact test and ball shear test have been used to investigate the joint strength. The joint strength of lead and lead-free solder joints under high strain rate condition were examined. Microstructure in the as-reflowed condition and fracture surfaces were investigated. The intermetallic compounds of Sn-3Ag-0.5Cu joints demonstrated as layer-type (Cu, Ni)6Sn5. Fractographies show that all of Sn37Pb solder joints exhibit the ductile fracture mode in both tests. On the other hand, Sn-3Ag-0.5Cu solder joints exhibit the interfacial fracture mode. The characteristic curve in both tests could demonstrate the failure feature. The ductile fracture behavior exhibits a long displacement and high fracture energy in both tests. The interfacial fracture behavior exhibits a short range displacement and low fracture energy during the test.
  • Keywords
    copper alloys; crystal microstructure; ductile fracture; fractography; fracture; impact testing; interface structure; silver alloys; solders; tin alloys; SnAgCu; ball impact test; ball shear test; displacement; ductile fracture mode; fractography; fracture energy; fracture surface; interfacial fracture; intermetallic compound; joint strength; solder joint microstructure; strain rate; Environmentally friendly manufacturing techniques; Gold; Intermetallic; Lead; Microstructure; Soldering; Surface cracks; Surface finishing; Surface morphology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784286
  • Filename
    4784286