• DocumentCode
    274756
  • Title

    Photovoltaic Hg1-xCdxTe detectors for 12 μm application

  • Author

    Wollrab, R. ; Bauer, A. ; Bruder, M. ; Wendler, J. ; Ziegler, J. ; Maier, H.

  • Author_Institution
    AEG, Remscheid, West Germany
  • fYear
    1990
  • fDate
    5-7 Jun 1990
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    Hg1-xCdxTe (MCT) is the most important material for infrared quantum detectors in the wavelength range of 8-12 μm. The authors have manufactured bilinear arrays of photovoltaic detectors for the 12 μm wavelength region using a planar diffusion technology on MCT epilayers grown on CdZnTe substrates. The diodes show large Rshunt and R0A values, nearly zero low-frequency noise even below 10 Hz, and very homogeneous photocurrent and detectivity over the array, both at 77 and 65 K. The temperature dependence of D* and R0A corresponds to the theoretically expected behaviour
  • Keywords
    II-VI semiconductors; cadmium compounds; infrared detectors; mercury compounds; photovoltaic cells; semiconductor epitaxial layers; substrates; zinc compounds; 65 K; 77 K; 8 to 12 micron; CdZnTe; Hg1-xCdxTe-CdZnTe; II-VI semiconductors; MCT; MCT epilayers; bilinear arrays; infrared quantum detectors; photocurrent; photovoltaic detector; planar diffusion technology; temperature dependence;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced Infrared Detectors and Systems, 1990., Fourth International Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-86341-702-7
  • Type

    conf

  • Filename
    98637