Title :
Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
Author :
Konuk, Haluk ; Ferguson, F. Joel
Author_Institution :
Hewlett Packard Co., CA, USA
Abstract :
Shorts and opens are the most common types of defects in today´s CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare the factors affecting the probabilities for an interconnect open and a feedback bridging fault to oscillate or display sequential behavior
Keywords :
CMOS digital integrated circuits; circuit feedback; fault diagnosis; integrated circuit interconnections; wiring; digital CMOS circuits; feedback bridging fault; interconnect opens; interconnect wiring; probabilities; sequential behavior; CMOS digital integrated circuits; CMOS logic circuits; Capacitance; Circuit faults; Circuit testing; Design engineering; Feedback circuits; Integrated circuit interconnections; Wires; Wiring;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639668
