• DocumentCode
    2748701
  • Title

    Stress analysis of unilateral cleft palate using a three dimensional finite element model of pediatric subject -specific maxilla

  • Author

    Zhao, Linping ; Patel, P.K. ; Harris, G.F.

  • Author_Institution
    Shriners Hosp. for Children, Chicago, IL, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    5077
  • Lastpage
    5079
  • Abstract
    For children with cleft palate, oral function is impaired. The hypothesis is that the stress and strain distribution within the affected maxilla with a cleft during functional tasks such as biting and chewing is abnormal and can significantly affect bone development in the growing child. To test this hypothesis, a three-dimensional finite element model of a pediatric subject-specific maxilla with and without unilateral cleft palate was established based upon pediatric subject-specific bony geometry. The stress and strain distribution of the maxillary alveolar region subjected to typical functional loads was analyzed. The preliminary results revealed that both Von Mises stress and maximum principle stress as well as principle strain distribution were unevenly distributed between the hemi-maxillae.
  • Keywords
    biomechanics; bone; finite element analysis; paediatrics; physiological models; stress analysis; stress-strain relations; Von Mises stress; biting; bone development; chewing; children; hemi-maxillae; impaired oral function; maxillary alveolar region; maximum principle stress; pediatric subject -specific maxilla; principle strain distribution; strain distribution; stress analysis; stress distribution; three dimensional finite element model; unilateral cleft palate; Birth disorders; Bones; Capacitive sensors; Finite element methods; Hospitals; Pediatrics; Skull; Solid modeling; Stress; Testing; Unilateral cleft palate; biomechanics; finite element model; maxilla;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1404403
  • Filename
    1404403