Optical Properties of Multilayer Thin-Film Interference Filters

Author

Yaremchuk, Iryna Y. ; Fitio, Volodymyr M. ; Bobitski, Yaroslav V.

Author_Institution

Dept. of Photonics, Lviv Polytech Nat. Univ.

fYear

2006

fDate

June 29 2006-July 1 2006

Firstpage

117

Lastpage

120

Abstract

The spectral properties of multilayer interference systems produced by multiple repeating of symmetric tree-component period, especially, the tree-component construction of dielectric thin films and the types of dielectric-metal-dielectric systems, were investigation. These thin films structures can be used as infrared interference filters as well as a standard for calibration of different spectral devises. The transmission and reflection analysis of these systems using matrix method was conducted. The obtained results allow to select systems with spectral characteristics that fit with applied problems

Keywords

interference filters; matrix algebra; optical multilayers; dielectric-metal-dielectric systems; infrared interference filters; matrix method; multilayer thin-film; reflection analysis; transmission analysis; tree-component construction; Coatings; Dielectric thin films; Interference; Nonhomogeneous media; Optical films; Optical filters; Optical reflection; Optical refraction; Optical variables control; Refractive index; interference; multilayer system; thin-films filter;

fLanguage

English

Publisher

ieee

Conference_Titel

Laser and Fiber-Optical Networks Modeling, 8-th International Conference on

Conference_Location

Kharkiv

Print_ISBN

1-4244-0233-6

Electronic_ISBN

1-4244-0234-4

Type

conf

DOI

10.1109/LFNM.2006.251997

Filename

4018216