Title :
Optical Properties of Multilayer Thin-Film Interference Filters
Author :
Yaremchuk, Iryna Y. ; Fitio, Volodymyr M. ; Bobitski, Yaroslav V.
Author_Institution :
Dept. of Photonics, Lviv Polytech Nat. Univ.
fDate :
June 29 2006-July 1 2006
Abstract :
The spectral properties of multilayer interference systems produced by multiple repeating of symmetric tree-component period, especially, the tree-component construction of dielectric thin films and the types of dielectric-metal-dielectric systems, were investigation. These thin films structures can be used as infrared interference filters as well as a standard for calibration of different spectral devises. The transmission and reflection analysis of these systems using matrix method was conducted. The obtained results allow to select systems with spectral characteristics that fit with applied problems
Keywords :
interference filters; matrix algebra; optical multilayers; dielectric-metal-dielectric systems; infrared interference filters; matrix method; multilayer thin-film; reflection analysis; transmission analysis; tree-component construction; Coatings; Dielectric thin films; Interference; Nonhomogeneous media; Optical films; Optical filters; Optical reflection; Optical refraction; Optical variables control; Refractive index; interference; multilayer system; thin-films filter;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling, 8-th International Conference on
Conference_Location :
Kharkiv
Print_ISBN :
1-4244-0233-6
Electronic_ISBN :
1-4244-0234-4
DOI :
10.1109/LFNM.2006.251997
