Title :
High frequency and crosstalk analysis of VLSI carbon nanotube nanointerconnects
Author :
Chiariello, A.G. ; Maffucci, A. ; Miano, G. ; Villone, F.
Author_Institution :
DIEL, Univ. di Napoli Federico II, Naples, Italy
Abstract :
The paper investigates the EMC behavior of carbon nanotube interconnects, which are candidate to replace copper in future nanoscale technology. In particular, two problems are addressed: the influence of the kinetic inductance on the high-frequency behavior and the crosstalk performances of such interconnects. A recently proposed model is used to describe these interconnects within the frame of the classical transmission line theory, while retaining the necessary accuracy in describing the typical quantistic and inertial effects involved at such a scale.
Keywords :
VLSI; carbon nanotubes; crosstalk; electromagnetic shielding; nanoelectronics; nanotechnology; transmission line theory; C; EMC; VLSI carbon nanotube nanointerconnects; crosstalk; kinetic inductance; transmission line theory; Carbon nanotubes; Copper; Crosstalk; Electromagnetic compatibility; Frequency; Inductance; Kinetic theory; Paper technology; Transmission line theory; Very large scale integration; Carbon nanotube interconnects; crosstalk; nanotechnology;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2009 International Symposium on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-4107-5
Electronic_ISBN :
978-1-4244-4108-2
DOI :
10.1109/EMCEUROPE.2009.5189688