DocumentCode
2749334
Title
Sampling systems with fractional-delay applied to high-accuracy measurements
Author
Vasconcellos, Renata T de Barros e ; De Campos, Marcello L R
Author_Institution
Capacitance & Inductance Lab., INMETRO, Duque de Caxias, Brazil
fYear
2012
fDate
1-6 July 2012
Firstpage
438
Lastpage
439
Abstract
For high-accuracy AC voltage measurements, sampling errors can contribute significantly to increase the incertitude. Fractional delay is a simple technique to reduce sampling errors, improving the accuracy of electrical digital measurements. In this paper we combine the fractional delay sampling technique with Principal Component Analysis, applying this technique to high-accuracy measurements.
Keywords
principal component analysis; sampling methods; voltage measurement; electrical digital measurements; fractional delay sampling technique; high-accuracy AC voltage measurements; high-accuracy measurements; principal component analysis; sampling error reduction; Correlation; Delay; Estimation; Harmonic analysis; Matrix decomposition; Principal component analysis; Voltage measurement; Electrical Metrology; Fractional Delay; Principal Component Analysis; Sampling Systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6250991
Filename
6250991
Link To Document