Title :
Sampling systems with fractional-delay applied to high-accuracy measurements
Author :
Vasconcellos, Renata T de Barros e ; De Campos, Marcello L R
Author_Institution :
Capacitance & Inductance Lab., INMETRO, Duque de Caxias, Brazil
Abstract :
For high-accuracy AC voltage measurements, sampling errors can contribute significantly to increase the incertitude. Fractional delay is a simple technique to reduce sampling errors, improving the accuracy of electrical digital measurements. In this paper we combine the fractional delay sampling technique with Principal Component Analysis, applying this technique to high-accuracy measurements.
Keywords :
principal component analysis; sampling methods; voltage measurement; electrical digital measurements; fractional delay sampling technique; high-accuracy AC voltage measurements; high-accuracy measurements; principal component analysis; sampling error reduction; Correlation; Delay; Estimation; Harmonic analysis; Matrix decomposition; Principal component analysis; Voltage measurement; Electrical Metrology; Fractional Delay; Principal Component Analysis; Sampling Systems;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250991