DocumentCode :
2749334
Title :
Sampling systems with fractional-delay applied to high-accuracy measurements
Author :
Vasconcellos, Renata T de Barros e ; De Campos, Marcello L R
Author_Institution :
Capacitance & Inductance Lab., INMETRO, Duque de Caxias, Brazil
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
438
Lastpage :
439
Abstract :
For high-accuracy AC voltage measurements, sampling errors can contribute significantly to increase the incertitude. Fractional delay is a simple technique to reduce sampling errors, improving the accuracy of electrical digital measurements. In this paper we combine the fractional delay sampling technique with Principal Component Analysis, applying this technique to high-accuracy measurements.
Keywords :
principal component analysis; sampling methods; voltage measurement; electrical digital measurements; fractional delay sampling technique; high-accuracy AC voltage measurements; high-accuracy measurements; principal component analysis; sampling error reduction; Correlation; Delay; Estimation; Harmonic analysis; Matrix decomposition; Principal component analysis; Voltage measurement; Electrical Metrology; Fractional Delay; Principal Component Analysis; Sampling Systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6250991
Filename :
6250991
Link To Document :
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