• DocumentCode
    2749334
  • Title

    Sampling systems with fractional-delay applied to high-accuracy measurements

  • Author

    Vasconcellos, Renata T de Barros e ; De Campos, Marcello L R

  • Author_Institution
    Capacitance & Inductance Lab., INMETRO, Duque de Caxias, Brazil
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    438
  • Lastpage
    439
  • Abstract
    For high-accuracy AC voltage measurements, sampling errors can contribute significantly to increase the incertitude. Fractional delay is a simple technique to reduce sampling errors, improving the accuracy of electrical digital measurements. In this paper we combine the fractional delay sampling technique with Principal Component Analysis, applying this technique to high-accuracy measurements.
  • Keywords
    principal component analysis; sampling methods; voltage measurement; electrical digital measurements; fractional delay sampling technique; high-accuracy AC voltage measurements; high-accuracy measurements; principal component analysis; sampling error reduction; Correlation; Delay; Estimation; Harmonic analysis; Matrix decomposition; Principal component analysis; Voltage measurement; Electrical Metrology; Fractional Delay; Principal Component Analysis; Sampling Systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6250991
  • Filename
    6250991